Publication

International Conferences

Year 2025

No.

Publication

Title


1.

IEEE/ACM Design, Automation and Test in Europe Conference & Exhibition (DATE)

Trans-Net: Knowledge-Transferring Analog Circuit Optimizer with a Netlist-Based Circuit Representation

Author | Ho-Jin Lee, Kyeong-Jun Lee, Youngchang Choi, Kyongsu Lee, Seokhyeong Kang, and Jae-Yoon Sim


2.

IEEE Symposium on VLSI Technology and Circuits (VLSI)


An 8K-Spin Ising Machine IC with Reconfigurable Many-Body Spin Interactions and Limitless Multichip Extension (ACCEPTED)

Author | Jaeyeong Kim, and Jae-Yoon Sim


3.

IEEE Symposium on VLSI Technology and Circuits (VLSI)

A 10.42μW/Ch. PPG Sensor with a Zoomed Sampling Based on Velocity of Blood Flow  (ACCEPTED)

Author | Kyu-Jin Choi, ByungJun Kim (equally contributed), and Jae-Yoon Sim


4.

IEEE Symposium on VLSI Technology and Circuits (VLSI)

A 1.7 pJ/bit 10 MHz Calibration-Free PVT Variation and Mismatch Tolerant Latch-Based True Random Number Generator in 4 nm FinFET  (ACCEPTED)

Author | Jaehoon Lee, Jongmi Lee (equally contributed), Yelim Youn, Yong Lim, Dongyeon Hong, Bogyeong Kang, Sangmin Yoo, and Jae-Yoon Sim