Publication

Title

An In-Band Noise Filtering 32-tap FIR-Embedded ΔΣ Digital Fractional-N PLL

Author | Jong Mi Lee, Dong-Woo Jee, Byungsub Kim, Hong-June Park, Jae-Yoon Sim

Digitally controlled leakage-based oscillator and fast relocking MDLL for ultra low power sensor platform

Author | Jee Dong-Woo, Sylvester Dennis, Blaauw David, Jae-Yoon Sim 

Analytical Formulas for Tradeoff Among Channel Loss, Length, and Frequency of RC- and LC-Dominant Single-Ended Interconnects for Fast Equalized Link Tradeoff Estimation

Author | Minsoo Choi, Kwangmin Kim, Jae-Yoon Sim, Hong-June Park, Byungsub Kim

EMI Issues in Pseudo-Differential Signaling for SDRAM Interface

Author | Young-Jae Jang, Il-Min Yi, Byungsub Kim, Jae-Yoon Sim, Hong-June Park

Characterization and Effects of Ar/Air Microwave Plasma on Wound Healing

Author | H.Y.Kim, S.K.Kang, S.M.Park, H.Y.Jung, B.H.Choi, J.Y.Sim, J.K.Lee

An OTA with Positive Feedback Bias Control for Power Adaptation Proportional to Analog Workloads

Author | Byungsub Kim, Jae-Yoon Sim, Hong-June Park

An Approximate Closed-Form Transfer Function Model for Diverse Differential Interconnects

Author | Minsoo Choi, Jae-Yoon Sim, Hong-June Park, Byungsub Kim

An Adaptive-Bandwidth Referenceless CDR with Small-area Coarse and Fine Frequency Detectors

Author | Hye-Jung Kwon, Ji-Hoon Lim, Byungsub Kim, Jae-Yoon Sim, Hong-June Park

An Adaptive Equalizer for High-Speed Receiver using a CDR-Assisted All-Digital Jitter Measurement

Author | Jong-Hoon Kim, Ji-Hoon Lim, Byungsub Kim, Jae-Yoon Sim, Hong-June Park

An LCD-VCOM-Noise Resilient Mutual-Capacitive Touch-Sensor IC Chip With a Low-Voltage Driving Signal

Author | Jae-Seung Lee, Dong-Hee Yeo, Hye-Jung Kwon, Byungsub Kim, Jae-Yoon Sim, Hong-June Park

A Single-Chip 32-Channel Analog Beamformer With 4-ns Delay Resolution and 768-ns Maximum Delay Range for Ultrasound Medical Imaging With a Linear Array Transducer

Author | Ji-Yong Um, Yoon-Jee Kim, Seong-Eun Cho, Min-Kyun Chae, Byungsub Kim, Jae-Yoon Sim, Hong-June Park

Cost-Efficient and Automatic Large Volume Data Acquisition Method for On-Chip Random Process Variation Measurement

Author | Sooeun Lee, Seungho Han, Ikho Lee, Jae-Yoon Sim, Hong-June Park, Byungsub Kim